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1

Analysis of Latchup susceptibility to internal logical states by using a Laser beam

P. Fouillat, H. Lapuyade, Y. Maidon, J.P. Dom

Journal:

Microelectronic Engineering

Year:

1996

Language:

english

File:

PDF, 437 KB

english, 1996

2

[IEEE 1998 IEEE International Workshop on IDDQ Testing - San Jose, CA, USA (November 12-13, 1998)] Proceedings 1998 IEEE International Workshop on IDDQ Testing (Cat. No.98EX232) - Off chip monitors and built in current sensors for analogue and mixed signal testing

Maidon, Y., Deval, Y., Manhaeve, H.

Year:

1998

Language:

english

File:

PDF, 43 KB

english, 1998

3

An Analog Circuit Fault Characterization Methodology

Yvan Maidon, Thomas Zimmer, André Ivanov

Journal:

Journal of Electronic Testing

Year:

2005

Language:

english

File:

PDF, 529 KB

english, 2005

4

[IEEE Comput. Soc Seventh International On-Line Testing Workshop. IOLTW 2001 - Taormina, Italy (9-11 July 2001)] Proceedings Seventh International On-Line Testing Workshop - A new laser system for X-rays flashes sensitivity evaluation

Lewis, D., Lapuyade, H., Deval, Y., Maidon, Y., Darracq, F., Briand, R., Fouillat, P.

Year:

2001

Language:

english

File:

PDF, 274 KB

english, 2001

5

[IEEE Comput. Soc. Press Digest of Papers 1996 IEEE International Workshop on IDDQ Testing - Washington, DC, USA (24-25 Oct. 1996)] Digest of Papers 1996 IEEE International Workshop on IDDQ Testing - On chip I/sub DDX/ sensor

Maidon, Y., Deval, Y., Fouillat, P., Tomas, J., Dom, J.P.

Year:

1996

Language:

english

File:

PDF, 296 KB

english, 1996

6

[IEEE Comput. Soc 6th IEEE International On-Line Testing Workshop - Palma de Mallorca, Spain (3-5 July 2000)] Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) - An improved CMOS BICS for on-line testing

Maidon, Y., Deval, Y., Begueret, J.B.

Year:

2000

Language:

english

File:

PDF, 110 KB

english, 2000

7

[IEEE Comput. Soc Digest of Papers IEEE International Workshop on IDDQ Testing - Washington, DC, USA (5-6 Nov. 1997)] Digest of Papers IEEE International Workshop on IDDQ Testing - On-line CMOS BICS: an experimental study

Maidon, Y., Deval, Y., Temas, J., Verdier, F., Begueret, J.B., Dom, J.P.

Year:

1997

Language:

english

File:

PDF, 396 KB

english, 1997

8

O05: Identification de déviants positifs au sein du projet Opticourses : des achats alimentaires équilibrés malgré un petit budget

Marty, L., Dubois, C., Gaubard, M.S., Maidon, A., Lesturgeon, A., Gaigi, H., Darmon, N.

Journal:

Nutrition Clinique et Métabolisme

Year:

2014

Language:

french

File:

PDF, 47 KB

french, 2014

9

Adaptive architecture for CMOS BICS

Maidon, Y., Deval, Y., Badets, F., Begueret, J.B.

Journal:

Electronics Letters

Year:

1999

Language:

english

File:

PDF, 127 KB

english, 1999

10

Higher nutritional quality at no additional cost among low-income households: insights from food purchases of "positive deviants"

Marty, L., Dubois, C., Gaubard, M. S., Maidon, A., Lesturgeon, A., Gaigi, H., Darmon, N.

Journal:

American Journal of Clinical Nutrition

Year:

2015

Language:

english

File:

PDF, 268 KB

english, 2015

11

3.3 V CMOS built-in current sensor

Maidon, Y., Deval, Y., Begueret, J.B., Tomas, J., Dom, J.P.

Journal:

Electronics Letters

Year:

1997

Language:

english

File:

PDF, 492 KB

english, 1997

12

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Using IDD to analyze analog faults and development of a sensor

Maidon, Yvan, Deval, Yann, Fremont, Helene, Dom, Jean P., Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Year:

1996

Language:

english

File:

PDF, 516 KB

english, 1996

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